LBNL-UCO/Lick high-resistivity CCD's
Dec 98/Jan 99 test results with new wafer (Richard Stover, Mingzhi Wei, Steve Holland)

1. 400 x 690 24-um pixel CCD

A picture goes here One of the first test images on the new wafer (full wafer test probe, warm) This is actually a front-illuminated CCD on a low-resistivity n-type substrate.

2. 2048 x 2048 15-um pixel CCD

The first high-resistivity wafer was the worst of the lot, and was viewed as a sacrificial lamb. The first cold-tested 2k x 2k CCD had problems, but nonetheless images were obtained and CTE measurements were made: "The CCD seems to have a vertical-to-channel short which severely limits the phase 1 high clock level. The image was taken with much lower vertical clock levels than normal, and there is still a large glowing region on the right hand side." All the measurments were obtained on the afternoon of 1998 Dec 23, and must be regarded as provisional. Among other things, there was no temperature monitoring, and the chip may have been too cold.
A picture goes here Click on figure for large gif version (102 kbytes)
A picture goes here Parallel CTE was 0.999998, or "5 9's and an 8."
Click on figure for large gif version (19 kbytes)
A picture goes here Measurements of QE and reflectivity (Lick) compared with LBNL modeling. The CTIO T2k QE and relative wideband filter responses are shown for comparison. 1999 Oct 15.

Other people's CCD's:

Lick/UCO MIT/Lincoln Labs CCID20 Test Results. Challenge: find the QE graphs.
Kitt Peak CCD characteristics
CCD's at Cerro Tololo
Evaluation results for the Suprime-Cam (Subaru Prime Focus Camera)

Don Groom

29-Dec-98